About Me
I am currently a PhD candidate at Katholieke Universiteit Leuven / IMEC vzw. I completed my graduate studies from Syracuse University in Electrical Engineering in 2005.
Research
For my PhD research I am with the MCA group at IMEC vzw. My PhD advisor is Prof. Wilfried Vandervorst.
Currently my research is in the area of Electrical Characterization of semiconductor devices using Scanning Probe Microscopy. The thrust of my PhD research is electrical characterization of active dopant concentration in FinFET-based devices using Scanning Spreading Resistance Microscopy (SSRM).
During my Master's studies, I was working on electrical environment profiling of SOI MOSFET's using TCAD software such as MEDICI.
